Tapping mode atomic force microscopy study of elastomers: Dynamics of tip-sample interaction.

被引:0
|
作者
Bar, G
Delineau, L
Brandsch, R
Whangbo, MH
机构
[1] Univ Freiburg, Freiburger Mat Forschungszentrum, D-79104 Freiburg, Germany
[2] N Carolina State Univ, Dept Chem, Raleigh, NC 27695 USA
关键词
D O I
暂无
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
278-POLY
引用
收藏
页码:U296 / U296
页数:1
相关论文
共 50 条
  • [31] Induced vibration contact detection for minimizing cantilever tip-sample interaction forces in jumping mode atomic force microscopy
    Xia, F.
    Bozchalooi, I. Soltani
    Youcef-Toumi, K.
    2017 AMERICAN CONTROL CONFERENCE (ACC), 2017, : 4141 - 4146
  • [32] Influence of atomic force microscope tip-sample interaction on the study of scaling behavior
    Aue, J
    DeHosson, JTM
    APPLIED PHYSICS LETTERS, 1997, 71 (10) : 1347 - 1349
  • [33] Electrostatic tip-sample interaction in immersion force microscopy of semiconductors
    Donolato, C
    PHYSICAL REVIEW B, 1996, 54 (03): : 1478 - 1481
  • [35] Effects of atomic arrangement at tip apex and tip-sample distance on atomic force microscopy images: a simulation study
    Komiyama, Masaharu
    Ohkubo, Shin'ya
    Tazawa, Katsuyuki
    Tsujimichi, Kazuya
    Hirotani, Akiyasu
    Kubo, Momoji
    Miyamoto, Akira
    Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers, 1996, 35 (4 A): : 2318 - 2325
  • [36] Effects of atomic arrangement at tip apex and tip-sample distance on atomic force microscopy images: A simulation study
    Komiyama, M
    Ohkubo, S
    Tazawa, K
    Tsujimichi, K
    Hirotani, A
    Kubo, M
    Miyamoto, A
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1996, 35 (4A): : 2318 - 2325
  • [37] Contact dynamics of tapping mode atomic force microscopy
    Zhang, Yin
    Zhao, Haisheng
    Zuo, Lijun
    JOURNAL OF SOUND AND VIBRATION, 2012, 331 (23) : 5141 - 5152
  • [38] Probing linear and non-linear tip-sample interaction forces by atomic force acoustic microscopy
    Rabe, U
    Kester, E
    Arnold, W
    SURFACE AND INTERFACE ANALYSIS, 1999, 27 (5-6) : 386 - 391
  • [39] Quantitative measurement of tip-sample interactions in amplitude modulation atomic force microscopy
    Hoelscher, H.
    APPLIED PHYSICS LETTERS, 2006, 89 (12)
  • [40] High-Speed Tapping Mode AFM Utilizing Recovery of Tip-Sample Interaction
    Noom, Jacques
    Smith, Carlas
    Verbiest, Gerard J.
    Katan, Allard J.
    Soloviev, Oleg
    Verhaegen, Michel
    IEEE TRANSACTIONS ON NANOTECHNOLOGY, 2023, 22 : 273 - 279