Joint modeling of laboratory and field data with application to warranty prediction for highly reliable products

被引:18
作者
Tseng, Sheng-Tsaing [1 ]
Hsu, Nan-Jung [1 ]
Lin, Yi-Chiao [2 ]
机构
[1] Natl Tsing Hua Univ, Inst Stat, Hsinchu, Taiwan
[2] Fu Bond Life Co, Taipei, Taiwan
关键词
Field failure rate prediction; go; no-go laboratory data; empirical Bayes inference; DEGRADATION TESTS; LIFE TESTS; RELIABILITY; GAMMA;
D O I
10.1080/0740817X.2015.1133941
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
To achieve a successful warranty management program, a good prediction of a product's field return rate during the warranty period is essential. This study aims to make field return rate predictions for a particular scenario, the one where multiple products have a similar design and discrete-type laboratory data together with continuous-type field data is available for each product. We build a hierarchical model to link the laboratory and field data on failure. The efficient sharing of information among products means that the proposed method generally provides a more stable laboratory summary for each individual product, especially for those cases with few or even no failures during the laboratory testing stage. Furthermore, a real case study is used to verify the proposed method. It is shown that the proposed method provides a better connection between laboratory reliability and field reliability, and this leads to a significant improvement in the estimated field return rate.
引用
收藏
页码:710 / 719
页数:10
相关论文
共 27 条
[1]  
Arnold StevenF., 1990, Mathematical Statistics
[2]  
Blischke WR, 2011, SPRINGER SER RELIAB, P1, DOI 10.1007/978-0-85729-647-4
[3]   Bayesian Methods for Estimating System Reliability Using Heterogeneous Multilevel Information [J].
Guo, Jiqiang ;
Wilson, Alyson G. .
TECHNOMETRICS, 2013, 55 (04) :461-472
[4]   Adaptive Warranty Prediction for Highly Reliable Products [J].
Hsu, Nan-Jung ;
Tseng, Sheng-Tsaing ;
Chen, Ming-Wei .
IEEE TRANSACTIONS ON RELIABILITY, 2015, 64 (03) :1057-1067
[5]   Integrated Approach for Field Reliability Prediction Based on Accelerated Life Testing [J].
Jiang, Mingxiao ;
Chen, Weiqiu .
QUALITY ENGINEERING, 2015, 27 (03) :317-328
[6]   Analysis of warranty claim data: a literature review [J].
Karim, Md. ;
Suzuki, Kazuyuki .
INTERNATIONAL JOURNAL OF QUALITY & RELIABILITY MANAGEMENT, 2005, 22 (07) :667-+
[7]   Analysis of Reliability and Warranty Claims in Products With Age and Usage Scales [J].
Lawless, J. F. ;
Crowder, M. J. ;
Lee, K. -A. .
TECHNOMETRICS, 2009, 51 (01) :14-24
[8]   Statistical analysis of product warranty data [J].
Lawless, JF .
INTERNATIONAL STATISTICAL REVIEW, 1998, 66 (01) :41-60
[9]  
Li M, 2014, J QUAL TECHNOL, V46, P1
[10]   Using Accelerated Life Tests Results to Predict Product Field Reliability [J].
Meeker, William Q. ;
Escobar, Luis A. ;
Hong, Yili .
TECHNOMETRICS, 2009, 51 (02) :146-161