An experimental study of defect determination using pulsed thermal non-destructive testing

被引：0

作者：

Umar, M. Z. ^{[1
]}

Ahmad, I. ^{[1
]}

Hamzah, A. R. ^{[2
]}

Abdullah, W. S. W. ^{[2
]}

机构：

[1] Univ Kebangsaan Malaysia, Dept Elect Elect & Syst Engn, Bangi 43600, Selangor, Malaysia

[2] Agensi Nuklear Malaysia, Bangi 43000, Selangor, Malaysia

来源：

CURRENT ISSUES OF PHYSICS IN MALAYSIA | 2008年 / 1017卷

关键词：

transient; Infrared Thermography; thermal NDT; artificial defect;

D O I：

暂无

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The application of Infrared Thermography (IRT) as passive method is widely used and accepted by industry. However, IRT technology as transient or active method is considerably new for industry in term of measuring defect in Non-Destructive Testing (NDT) activities. The primary objective of this paper is to present an experimental study of determination of artificial defect in material using active thermography, in particular to pulsed thermal NDT (TNDT). Both terminology and basic principles in TNDT will be discussed. It is shown that several factors may influences TNDT results. As a conclusion, this study has confirmed the ability and potential of TNDT as a technique for defect determination in material.

引用

页码：215 / +

页数：2