Electrical transport properties of CuS single crystals

被引:26
作者
Casaca, A. [1 ,2 ]
Lopes, E. B. [1 ]
Goncalves, A. P. [1 ]
Almeida, M. [1 ]
机构
[1] Inst Tecnol & Nucl CFMC UL, Dept Quim, P-2686953 Sacavem, Portugal
[2] Inst Super Engn Lisboa, P-1959007 Lisbon, Portugal
关键词
METAL-INSULATOR-TRANSITION; COPPER SULFIDE; LARGE MAGNETORESISTANCE; THIN-FILMS; PHASE; THERMOPOWER; ANISOTROPY; GROWTH;
D O I
10.1088/0953-8984/24/1/015701
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Electrical resistivity, transverse magnetoresistance and thermoelectric power measurements were performed on CuS high quality single crystals in the range 1.2-300 K and under fields of up to 16 T. The zero field resistivity data are well described below 55 K by a quasi-2D model, consistent with a carrier confinement at lower temperatures, before the transition to the superconducting state. The transverse magnetoresistance develops mainly below 30 K and attains values as large as 470% for a 16 T field at 5 K, this behaviour being ascribed to a band effect mechanism, with a possible magnetic field induced DOS change at the Fermi level. The transverse magnetoresistance shows no signs of saturation, following a power law with field Delta rho/rho(0) proportional to H-1.4, suggesting the existence of open orbits for carriers at the Fermi surface. The thermoelectric power shows an unusual temperature dependence, probably as a result of the complex band structure of CuS.
引用
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页数:6
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