Linear self-referencing techniques for short-optical-pulse characterization [Invited]

被引：33
作者：
Dorrerl, C. [1 ]
Kang, I. [2 ]
机构：
[1] Univ Rochester, Laser Energet Lab, Rochester, NY 14623 USA
[2] Alcatel Lucent, Holmdel, NJ 07733 USA
来源：
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS | 2008年 / 25卷 / 06期
关键词：
D O I：
10.1364/JOSAB.25.0000A1
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Linear self-referencing techniques for the characterization of the electric field of short optical pulses are presented. The theoretical and practical advantages of these techniques are developed. Experimental implementations are described, and their performance is compared to the performance of their nonlinear counterparts. Linear techniques demonstrate unprecedented sensitivity and are a perfect fit in many domains where the precise, accurate measurement of the electric field of an optical pulse is required. (C) 2008 Optical Society of America.
引用
收藏
页码：A1 / A12
页数：12
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