[1] Urmia Univ, Microelect Res Ctr, Orumiyeh 57159, Iran
[2] Univ Oslo, Dept Informat, Oslo, Norway
来源:
PROCEEDINGS OF THE 2019 26TH INTERNATIONAL CONFERENCE MIXED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS (MIXDES 2019)
|
2019年
关键词:
Clock and Data Recovery (CDR);
Half Rate (HR) Phase Detector (PD);
low jitter;
fast lock;
DATA-RECOVERY CIRCUIT;
CLOCK RECOVERY;
D O I:
10.23919/mixdes.2019.8787120
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
A half-rate CDR architecture is presented which exploits an improved half-rate Linear Phase Detector (LPD) and a proposed half-rate Multi-Level Bang Bang PD (MLBBPD) incorporated in a Composite PD (CPD) to benefit the advantages of both the MLBBPD and LPD such as fast locking and good jitter performance, respectively. The proposed half-rate LPD in contrast with a conventional counterpart generates the error and reference signals with the equivalent pulse width, thus obviating to employ asymmetric charge pump, also relaxes the speed requirement of other related circuits. Finally, its systematic phase offset is zero. During lock acquisition, the MLBBPD controls the CDR loop due to fast lock time. At locked state, the LPD establishes the loop owing to better jitter operation. Switching between the MLBBPD and LPD is performed through a proposed Lock Detector (LD). At the locked state, if the phase difference between the data and the clock be greater than 45 degrees, the LD selects the MLBBPD to decrease it below 45 degrees, and again the LPD is selected. Simulations accomplished by Verilog-AMS model in HSPICE-RF simulator and the results confirm our statements.
机构:
Univ Minnesota, Grad Program Comp Engn, Minneapolis, MN 55455 USA
Toshiba Amer Elect Components Inc, Bloomington, MN USA
AMCC, Edina, MN USAUniv Minnesota, Grad Program Comp Engn, Minneapolis, MN 55455 USA
Hsieh, Ming-ta
Sobelman, Gerald E.
论文数: 0引用数: 0
h-index: 0
机构:
Univ Minnesota, Grad Program Comp Engn, Minneapolis, MN 55455 USA
Rockefeller Univ, New York, NY 10021 USAUniv Minnesota, Grad Program Comp Engn, Minneapolis, MN 55455 USA
机构:
Univ Minnesota, Grad Program Comp Engn, Minneapolis, MN 55455 USA
Toshiba Amer Elect Components Inc, Bloomington, MN USA
AMCC, Edina, MN USAUniv Minnesota, Grad Program Comp Engn, Minneapolis, MN 55455 USA
Hsieh, Ming-ta
Sobelman, Gerald E.
论文数: 0引用数: 0
h-index: 0
机构:
Univ Minnesota, Grad Program Comp Engn, Minneapolis, MN 55455 USA
Rockefeller Univ, New York, NY 10021 USAUniv Minnesota, Grad Program Comp Engn, Minneapolis, MN 55455 USA