Quantitative anomalous small-angle X-ray scattering - The determination of chemical concentrations in nano-scaled phases

被引:13
作者
Goerigk, G. [1 ]
Huber, K. [2 ]
Mattern, N. [3 ]
Williamson, D. L. [4 ]
机构
[1] Helmholtz Zentrum Berlin, Inst Soft Matter & Funct Mat, Berlin, Germany
[2] Univ Paderborn, Fak Nat Wissensch, Paderborn, Germany
[3] Leibniz Inst IFW Dresden, Inst Complex Mat, Dresden, Germany
[4] Colorado Sch Mines, Golden, CO 80401 USA
关键词
SILICON-GERMANIUM ALLOYS; HYDROGENATED AMORPHOUS-SILICON; CALCIUM-INDUCED SHRINKING; VAPOR-DEPOSITION; A-SIGE; POLYACRYLATE CHAINS; POOR SOLVENTS; H ALLOYS; POLYELECTROLYTES; ASAXS;
D O I
10.1140/epjst/e2012-01623-2
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
In the last years Anomalous Small-Angle X-ray Scattering became a precise quantitative method resolving scattering contributions two or three orders of magnitude smaller compared to the overall small-angle scattering, which are related to the so-called pure-resonant scattering contribution. Additionally to the structural information precise quantitative information about the different constituents of multi-component systems like the fraction of a chemical component implemented into the materials nanostructures are obtained from these scattering contributions. The application of the Gauss elimination algorithm to the vector equation established by ASAXS measurements at three X-ray energies is demonstrated for three examples from chemistry and solid state physics. All examples deal with the quantitative analysis of the Resonant Invariant (RI-analysis). From the integrals of the pure-resonant scattering contribution the chemical concentrations in nano-scaled phases are determined. In one example the correlated analysis of the Resonant Invariant and the Non-resonant Invariant (NI-analysis) is employed.
引用
收藏
页码:259 / 274
页数:16
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