Frequency analysis of a self-bending point spread function for 3D localization-based optical microscopy

被引:4
作者
Schroeder, Bryce [1 ,2 ]
Jia, Shu [1 ]
机构
[1] SUNY Stony Brook, Dept Biomed Engn, Stony Brook, NY 11794 USA
[2] SUNY Stony Brook, Med Scientist Training Program, Stony Brook, NY 11794 USA
关键词
RECONSTRUCTION MICROSCOPY; DIFFRACTION-LIMIT; NANOSCOPY; STORM; FIELD;
D O I
10.1364/OL.40.003189
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We developed several approaches to characterize the recently reported self-bending point spread function for 3D localization-based light microscopy. Experimentally, we generated Gaussian, astigmatic, and self-bending point spread functions. We compared the optical transfer functions, ambiguity functions, and Fisher information of these point spread functions. Our comprehensive frequency-domain analysis describes quantitative tools for the development of engineered point spread functions for 3D imaging systems. (C) 2015 Optical Society of America
引用
收藏
页码:3189 / 3192
页数:4
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