Development and performance of a fast fibre-plate coupled CCD camera at medium energy and image processing system for electron holography

被引:24
作者
Daberkow, I
Herrmann, KH
Liu, L
Rau, WD
Tietz, H
机构
[1] UNIV TUBINGEN,INST APPL PHYS,D-72076 TUBINGEN,GERMANY
[2] AT&T BELL LABS,HOLMDEL,NJ 07733
关键词
D O I
10.1016/0304-3991(96)00013-7
中图分类号
TH742 [显微镜];
学科分类号
摘要
A new slow-scan CCD camera with a readout speed of either 2 MHz or 150 kHz has been developed for electron microscopy at medium energy. Rules for the design of electron image converters will be presented, and the most relevant data - such as sensitivity, modulation transfer function (MTF), and detective quantum efficiency (DQE) - of two different scintillator types (single-crystal YAG and poly-crystal P20) are measured. The camera is fully integrated into the image processing system VIPS-1000, which is designed for electron microscopy including remote control functions. The modular software package EM-MENU contains a broad range of functions optimized for fast and user-friendly operation of the TEM. Two application programs for object wave reconstruction by off-axis holography or focus variation will be presented.
引用
收藏
页码:35 / 48
页数:14
相关论文
共 29 条
[1]  
[Anonymous], ADV OPTICAL ELECT MI
[2]  
[Anonymous], 1991, Advances in optical and electron microscopy
[3]  
AUTRATA R, SCANNING ELECT MICRO, P489
[4]  
BRIL A, 1962, LUMINESCENCE ORGANIC, P479
[5]  
COENE W, 1992, PHYS REV LETT, V29
[6]   PERFORMANCE OF ELECTRON IMAGE CONVERTERS WITH YAG SINGLE-CRYSTAL SCREEN AND CCD SENSOR [J].
DABERKOW, I ;
HERRMANN, KH ;
LIU, LB ;
RAU, WD .
ULTRAMICROSCOPY, 1991, 38 (3-4) :215-223
[7]  
Dainty JC., 1974, IMAGE SCI
[8]   METHODS TO MEASURE PROPERTIES OF SLOW-SCAN CCD CAMERAS FOR ELECTRON DETECTION [J].
DERUIJTER, WJ ;
WEISS, JK .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1992, 63 (10) :4314-4321
[9]   TOWARDS AUTOMATIC ELECTRON TOMOGRAPHY [J].
DIERKSEN, K ;
TYPKE, D ;
HEGERL, R ;
KOSTER, AJ ;
BAUMEISTER, W .
ULTRAMICROSCOPY, 1992, 40 (01) :71-87
[10]   COMA-FREE ALIGNMENT OF A HIGH-RESOLUTION ELECTRON-MICROSCOPE WITH 3-FOLD ASTIGMATISM [J].
ISHIZUKA, K .
ULTRAMICROSCOPY, 1994, 55 (04) :407-418