Characterization of "blinking pixels" in CMOS image sensors

被引:6
作者
Ackerson, Kristin [1 ]
Musante, Charles [1 ]
Gambino, Jeffrey [1 ]
Ellis-Monaghan, John [1 ]
Maynard, Daniel [1 ]
Rassel, Richard J. [1 ]
Ogg, Kevin [1 ]
Jaffe, Mark [1 ]
机构
[1] IBM Microelect, Essex Jct, VT 05452 USA
来源
2008 IEEE/SEMI ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE | 2008年
关键词
D O I
10.1109/ASMC.2008.4529048
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:255 / 258
页数:4
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