Characterization of "blinking pixels" in CMOS image sensors

被引：6

作者：

Ackerson, Kristin ^{[1
]}

Musante, Charles ^{[1
]}

Gambino, Jeffrey ^{[1
]}

Ellis-Monaghan, John ^{[1
]}

Maynard, Daniel ^{[1
]}

Rassel, Richard J. ^{[1
]}

Ogg, Kevin ^{[1
]}

Jaffe, Mark ^{[1
]}

机构：

[1] IBM Microelect, Essex Jct, VT 05452 USA

来源：

2008 IEEE/SEMI ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE | 2008年

关键词：

D O I：

10.1109/ASMC.2008.4529048

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：255 / 258

页数：4

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