Characterization of "blinking pixels" in CMOS image sensors

被引：6
作者：
Ackerson, Kristin [1 ]
Musante, Charles [1 ]
Gambino, Jeffrey [1 ]
Ellis-Monaghan, John [1 ]
Maynard, Daniel [1 ]
Rassel, Richard J. [1 ]
Ogg, Kevin [1 ]
Jaffe, Mark [1 ]
机构：
[1] IBM Microelect, Essex Jct, VT 05452 USA
来源：
2008 IEEE/SEMI ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE | 2008年
关键词：
D O I：
10.1109/ASMC.2008.4529048
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：255 / 258
页数：4
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