X-ray absorption K edge as a diagnostic of the electronic temperature in warm dense aluminum

被引：29

作者：

Dorchies, F. ^{[1
]}

Festa, F. ^{[2
,3
]}

Recoules, V. ^{[3
]}

Peyrusse, O. ^{[1
]}

Benuzzi-Mounaix, A. ^{[2
]}

Brambrink, E. ^{[2
]}

Levy, A. ^{[2
]}

Ravasio, A. ^{[2
]}

Koenig, M. ^{[2
]}

Hall, T. ^{[4
]}

Mazevet, S. ^{[5
]}

机构：

[1] Univ Bordeaux, CNRS, Ctr Lasers Intenses & Applicat, UMR 5107,CEA, F-33400 Talence, France

[2] Ecole Polytech, Lab Utilisat Lasers Intenses, UMR 7605, F-91128 Palaiseau, France

[3] CEA DAM DIF, F-91297 Arpajon, France

[4] Univ Essex Colchester, Dept Phys, Colchester, Essex, England

[5] Univ Paris Diderot, CNRS, LUTH, Observat Paris, F-92195 Meudon, France

来源：

PHYSICAL REVIEW B | 2015年 / 92卷 / 08期

关键词：

EQUATION-OF-STATE;

D O I：

10.1103/PhysRevB.92.085117

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The use of the x-ray absorption K-edge slope is investigated as a model-free diagnostic of the electronic temperature in warm dense matter. Data are reported for aluminum in a wide domain of densities (approximately one to three times the solid density) and temperatures (similar to 0.1-10 eV). Measurements are obtained from laser-shock compression where both temperature and density are independently determined from optical diagnostics. They are compared with two different theoretical approaches, respectively, based on quantum molecular dynamics and multiple scattering. Extrapolation for other absorption edges and materials is discussed.

引用

页数：5

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