A 3 GHz Wideband ΣΔ Fractional-N Synthesizer With Switched-RC Sample-and-Hold PFD

被引:5
作者
Hedayati, H. [1 ]
Bakkaloglu, B. [2 ]
机构
[1] Marvell Semicond, Santa Clara, CA 95054 USA
[2] Arizona Sate Univ, Dept Elect Engn, Tempe, AZ 85287 USA
关键词
Sigma Delta fractional-N synthesizer; phase-locked loop (PLL); quantization noise; FREQUENCY-SYNTHESIZER; BANDWIDTH; OFFSET; PLL;
D O I
10.1109/TVLSI.2011.2161500
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Designing high linearity phase-frequency-detectors (PFDs) in low-voltage, deep submicrometer processes is a challenging problem. Nonlinear PFDs can fold out of band phase noise, and increase in-band phase noise of fractional-N PLLs in deep submicron processes. A 3-GHz Type-I Sigma Delta fractional-N PLL with an exponentially settling voltage-mode switched-RC phase frequency detector (PFD) is presented. A voltage-mode, fully settled switched-RC (SRC)-based sample-and-hold PFD, providing benefits of both an RC loop-filter and a zero-order hold sinc() suppressing reference clock leakage is presented. The exponentially settled SRC PFD is shown to reduce the in-band leakage of quantization noise by 13 dB in comparison to a similar current-mode charge pump PFD, enabling a measured loop-bandwidth of 890-kHz. The fractional-N PLL is fabricated in a 180-nm CMOS technology with 6 metal layers and consumes 18-mA from a 1.8-V power supply. The worst-case near-integer in-band spur is measured at -62 dBc. The measured in-band phase noise at 100-kHz offset from the 3-GHz carrier is -107 dBc/Hz and out-of-band phase noise at 3-MHz offset is -130 dBc/Hz. The phase-locked loop settling time for a frequency step of 45-MHz and 0.1-ppm accuracy is less than 10-mu s.
引用
收藏
页码:1681 / 1690
页数:10
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