Epitaxial Regrowth of Silicon for the Fabrication of Radial Junction Nanowire Solar Cells

被引:0
作者
Kendrick, Chito E. [1 ]
Eichfeld, Sarah M. [1 ]
Ke, Yue [1 ]
Weng, Xiaojun [1 ]
Wang, Xin [2 ]
Mayer, Theresa S. [2 ]
Redwing, Joan M. [1 ]
机构
[1] Penn State Univ, Dept Mat Sci & Engn, University Pk, PA 16802 USA
[2] Penn State Univ, Dept Elect Engn, University Pk, PA 16802 USA
来源
NANOEPITAXY: HOMO- AND HETEROGENEOUS SYNTHESIS, CHARACTERIZATION, AND DEVICE INTEGRATION OF NANOMATERIALS II | 2010年 / 7768卷
基金
美国国家科学基金会;
关键词
Solar Cell; Vapor Liquid Solid Growth; CVD; nanowires; ARRAYS;
D O I
10.1117/12.861571
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Radial p-n silicon nanowire (SiNW) solar cells are of interest as a potential pathway to increase the efficiency of crystalline silicon photovoltaics by reducing the junction length and surface reflectivity. Our studies have focused on the use of vapor-liquid-solid (VLS) growth in combination with chemical vapor deposition (CVD) processing for the fabrication of radial p-n junction SiNW array solar cells. High aspect ratio p-type SiNW arrays were initially grown on gold-coated (111) Si substrates by CVD using SiCl4 as the source gas and B2H6 as the p-type dopant source. The epitaxial re-growth of n-type Si shell layers on the Si nanowires was then investigated using SiH4 as the source gas and PH3 as the dopant. Highly conformal coatings were achieved on nanowires up to 25 mu m in length. The microstructure of the Si shell layer changed from polycrystalline to single crystal as the deposition temperature was raised from 650 degrees C to 950 degrees C. Electrical test structures were fabricated by aligning released SiNWs onto pre-patterned substrates via field-assisted assembly followed by selective removal of the n-type shell layer and contact deposition. Current-voltage measurements of the radial p-n SiNWs diodes fabricated with re-grown Si shell layers at 950 degrees C demonstrate rectifying behavior with an ideality factor of 1.93. Under illumination from an AM1.5g spectrum and efficiency for this single SiNW radial p-n junction was determined to be 1.8%, total wire diameter was 985 nm.
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页数:8
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