Voltammetric approach to redox behavior of various elements in cathode ray tube glass melts

被引:15
作者
Kim, Ki-Dong [1 ]
Kim, Young-Ho [1 ]
机构
[1] Kunsan Natl Univ, Fac Mat Sci & Nanochem Engn, Kunsan, Chunbuk, South Korea
关键词
electrochemical properties; oxidation reduction; voltammetry; glasses; oxide glasses;
D O I
10.1016/j.jnoncrysol.2007.07.064
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The redox behavior of various elements (Fe, Sb, Ce, Ti, Zn) was investigated in alkali-alkaline earth-silica CRT (Cathode ray tube: TV panel) model glass melts using the square-wave voltammetry (SWV). The current-potential curve, so called voltammogram, was produced at temperature range of 1000-1400 degrees C under the scanned potential between 0 and -800 mV at 100 Hz. The Fe, Ti and Zn doped melts exhibited one peak due to reduction reaction. In the case of the Sb doped melts, two traces doubted as peak were found in the voltammogram at low temperature while only one peak existed at high temperature. The peak potential was shifted to the negative direction with decrease of temperature, however, its temperature dependence showed linearity. On the other hand, no peak was found in voltammogram of the melts doped with Ce. Based on the temperature dependence of the peak potential, standard enthalpy (Delta H-0) and standard entropy (Delta S-0) for the reduction of Fe3+ to Fe2+, Sb3+ to Sb-0 and Zn2+ to Zn-0 in CRT model glass melts were calculated. (c) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码:553 / 557
页数:5
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