Process and Temperature Compensation for RF Low-Noise Amplifiers and Mixers

被引:40
作者
Gomez, Didac [1 ]
Sroka, Milosz [2 ]
Gonzalez Jimenez, Jose Luis [1 ]
机构
[1] Univ Politecn Cataluna, Dept Elect Engn, ES-08034 Barcelona, Spain
[2] Toshiba Co Ltd, Digital Media SoC Dept, Ctr Semicond Res & Dev, Kawasaki, Kanagawa 2128520, Japan
关键词
Low-noise amplifier (LNA); mixer; process compensation; RF integrated circuits; temperature compensation; FRONT-END; DESIGN;
D O I
10.1109/TCSI.2009.2031707
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Temperature and process variations have become key issues in the design of integrated circuits using deep submicron technologies. In RF front-end circuitry, many characteristics must be compensated in order to maintain acceptable performance across all process corners and throughout the temperature range. This paper proposes a new technique consisting of a compensation circuit that adapts and generates the appropriate bias voltage for LNAs and mixers so that the variability with temperature and process corners of their main performance metrics (S-parameters, gain, noise figure, etc.) is minimized.
引用
收藏
页码:1204 / 1211
页数:8
相关论文
共 15 条
[1]  
[Anonymous], 2007, 802154A2007 IEEE
[2]   An accurate automatic quality-factor tuning scheme for second-order LC filters [J].
Bahmani, Faramarz ;
Serrano-Gotarredona, Teresa ;
Sanchez-Sinencio, Edgar .
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2007, 54 (04) :745-756
[3]  
Chen F, 2004, IEEE INTERNATIONAL SYMPOSIUM ON COMMUNICATIONS AND INFORMATION TECHNOLOGIES 2004 (ISCIT 2004), PROCEEDINGS, VOLS 1 AND 2, P43
[4]   Circuit design of an on-chip temperature-compensated constant transconductance reference [J].
Chen, JW ;
Shi, BX .
ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING, 2003, 37 (03) :215-222
[5]   Self-calibration of input-match in RF front-end circuitry [J].
Das, T ;
Gopalan, A ;
Washburn, C ;
Mukund, PR .
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, 2005, 52 (12) :821-825
[6]  
FILANOSVSKY IM, 2000, IEEE INT S CIRC SYST, pV197
[7]  
Johns D. A., 2008, Analog integrated circuit design
[8]  
Lall P., 1997, Influence of temperature on microelectronics and system reliability
[9]  
Lee T. H., 2003, The Design of CMOS Radio-Frequency Integrated Circuits
[10]   Laser fine-tuneable deep-submicrometer CMOS 14-bit DAC [J].
Marche, David ;
Savaria, Yvon ;
Gagnon, Yves .
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2008, 55 (08) :2157-2165