Strain-Induced Changes in the Electronic Structure of MnCr2O4 Thin Films Probed by X-Ray Magnetic Circular Dichroism

被引：25

作者：

van der Laan, G. ^{[1
]}

Chopdekar, R. V. ^{[2
]}

Suzuki, Y. ^{[2
]}

Arenholz, E. ^{[3
]}

机构：

[1] Diamond Light Source, Didcot OX11 0DE, Oxon, England

[2] Univ Calif Berkeley, Dept Mat Sci & Engn, Berkeley, CA 94720 USA

[3] Univ Calif Berkeley, Lawrence Berkeley Lab, Adv Light Source, Berkeley, CA 94720 USA

来源：

PHYSICAL REVIEW LETTERS | 2010年 / 105卷 / 06期

关键词：

2P ABSORPTION-SPECTRA; GROUND-STATE MOMENTS; SYMMETRY;

D O I：

10.1103/PhysRevLett.105.067405

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We show that the angular dependence of x-ray magnetic circular dichroism (XMCD) is strongly sensitive to strain-induced electronic structure changes in magnetic transition metal oxides. We observe a pronounced dependence of the XMCD spectral shape on the experimental geometry as well as nonvanishing XMCD with distinct spectral features in transverse geometry in compressively strained MnCr2O4 films. The angular dependent XMCD can be described as a sum over an isotropic and anisotropic contribution, the latter linearly proportional to the axial distortion due to strain. The XMCD spectra are well reproduced by atomic multiplet calculations.

引用

页数：4

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