Nano-oxidation of ferromagnetic thin films as direct surface modification using AFM

被引：0

作者：

Takemura, Y ^{[1
]}

Shirakashi, J ^{[1
]}

机构：

[1] Yokohama Natl Univ, Yokohama, Kanagawa 2408501, Japan

来源：

MAGNETIC MATERIALS, PROCESSES, AND DEVICES VII AND ELECTRODEPOSITION OF ALLOYS, PROCEEDINGS | 2003年 / 2002卷 / 27期

关键词：

D O I：

暂无

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

NiFe thin films of 20 nm thickness were selectively oxidized using an atomic force microscope (AFM). The dot structures of NiFe -oxide were fabricated by applying a pulse voltage to the AFM cantilever. The height and diameter of the dots were controlled by changing the pulse voltage. The diameter of the dots did not strongly depended on the duration of the pulse. These experimental results are supported by the theoretical model assuming the threshold electric field strength for the oxidation.

引用

页码：444 / 449

页数：6

共 50 条

[41] The Study on the Fabrication of Nanostructure and Nanomold by Nano-oxidation and Hydrofluoric Acid Eetching on TiAlN Thin Film
Huang, Jen-Ching
Liu, Huail-Siang
Xue, Cheng-Shuo
Zhang, Gui-Jia
Zhan, Xin-Ming
JOURNAL OF THE CHINESE SOCIETY OF MECHANICAL ENGINEERS, 2013, 34 (04): : 353 - 359
[42] Surface modification on thin polymer films
Petri, DS
Wenz, G
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1998, 216 : U312 - U312
[43] Surface modification of thin polystyrene films
Siqueira-Petri, DF
Wenz, G
Schunk, P
Schimmel, T
Bruns, M
Dichtl, MA
COLLOID AND POLYMER SCIENCE, 1999, 277 (07) : 673 - 679
[44] Reduced humidity effects on probe nano-oxidation investigated using dynamic force microscope
Kuramochi, H
Ando, K
Tokizaki, T
Yokoyama, H
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2006, 45 (3B): : 2018 - 2021
[45] Single electron transistors (SETs) with Nb/Nb oxides system fabricated by atomic force microscope (AFM) nano-oxidation process
Shirakashi, J
Ishii, M
Matsumoto, K
Miura, N
Konagai, M
1996 54TH ANNUAL DEVICE RESEARCH CONFERENCE DIGEST, 1996, : 182 - 183
[46] Nano-oxidation and in situ faradaic current detection using dynamic carbon nanotube probes
Kuramochi, H
Ando, K
Shikakura, Y
Yasutake, M
Tokizaki, T
Yokoyama, H
NANOTECHNOLOGY, 2004, 15 (09) : 1126 - 1130
[47] Durability and Surface Oxidation States of Antiviral Nano-Columnar Copper Thin Films
Shigetoh, Keisuke
Hirao, Rie
Ishida, Nobuhiro
ACS APPLIED MATERIALS & INTERFACES, 2023, 15 (16) : 20398 - 20409
[48] Surface oxidation of Permalloy thin films
Fitzsimmons, MR
Silva, TJ
Crawford, TM
PHYSICAL REVIEW B, 2006, 73 (01)
[49] Calibrating the thickness of metal thin films using AFM
Jankovich, Adam
Chai, Minghui
Pavan, Barbara
Michael, Scott
Mellinger, Axel
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2010, 239
[50] Fabrication of single electron memory on atomically flat α-Al2O3 substrate made by AFM nano-oxidation process
Matsumoto, K
Gotoh, Y
Shirakashi, J
Maeda, T
Harris, JS
INTERNATIONAL ELECTRON DEVICES MEETING - 1997, TECHNICAL DIGEST, 1997, : 155 - 158

← 1 2 3 4 5 →