Simultaneous dual-wavelength off-axis flipping digital holography

被引:36
|
作者
Liu, Lei [1 ]
Shan, Mingguang [1 ]
Zhong, Zhi [1 ]
Liu, Bin [1 ]
Luan, Gunagyu [2 ]
Diao, Ming [1 ]
Zhang, Yabin [1 ]
机构
[1] Harbin Engn Univ, Coll Informat & Commun Engn, Harbin 150001, Heilongjiang, Peoples R China
[2] Heilongjiang Bayi Agr Univ, Coll Informat Technol, Daqing 163319, Heilongjiang, Peoples R China
基金
中国国家自然科学基金;
关键词
DIFFRACTION PHASE MICROSCOPY; INTERFEROMETRY; RECONSTRUCTION;
D O I
10.1364/OL.42.004331
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We develop a two-wavelength off-axis digital holography for quantitative phase imaging using flipping in a single interferogram shot. The interference is performed by flipping the relative position of a sample and reference beam, and the two-wavelength information is spatially multiplexed onto a monochromatic charge-coupled device camera simultaneously using polarization modulation. Due to the interferogram containing two-wavelength information with orthogonal interference fringes, the two-wavelength unwrapped information on the phase and thickness for the sample is extracted from a single shot. Our setup requires no pinholes, gratings, or dichroic mirrors with straightforward alignment. We demonstrate the operation of the setup with a step target and circular pillar. (C) 2017 Optical Society of America
引用
收藏
页码:4331 / 4334
页数:4
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