Simultaneous dual-wavelength off-axis flipping digital holography

被引：36

作者：

Liu, Lei ^{[1
]}

Shan, Mingguang ^{[1
]}

Zhong, Zhi ^{[1
]}

Liu, Bin ^{[1
]}

Luan, Gunagyu ^{[2
]}

Diao, Ming ^{[1
]}

Zhang, Yabin ^{[1
]}

机构：

[1] Harbin Engn Univ, Coll Informat & Commun Engn, Harbin 150001, Heilongjiang, Peoples R China

[2] Heilongjiang Bayi Agr Univ, Coll Informat Technol, Daqing 163319, Heilongjiang, Peoples R China

来源：

OPTICS LETTERS | 2017年 / 42卷 / 21期

基金：

中国国家自然科学基金;

关键词：

DIFFRACTION PHASE MICROSCOPY; INTERFEROMETRY; RECONSTRUCTION;

D O I：

10.1364/OL.42.004331

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We develop a two-wavelength off-axis digital holography for quantitative phase imaging using flipping in a single interferogram shot. The interference is performed by flipping the relative position of a sample and reference beam, and the two-wavelength information is spatially multiplexed onto a monochromatic charge-coupled device camera simultaneously using polarization modulation. Due to the interferogram containing two-wavelength information with orthogonal interference fringes, the two-wavelength unwrapped information on the phase and thickness for the sample is extracted from a single shot. Our setup requires no pinholes, gratings, or dichroic mirrors with straightforward alignment. We demonstrate the operation of the setup with a step target and circular pillar. (C) 2017 Optical Society of America

引用

页码：4331 / 4334

页数：4

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