Convenient method of X-ray absorption spectroscopy using EPMA

被引：0

作者：

Kawai, J ^{[1
]}

Hayashi, K ^{[1
]}

机构：

[1] Kyoto Univ, Grad Sch Engn, Sakyo Ku, Kyoto 6068501, Japan

来源：

TETSU TO HAGANE-JOURNAL OF THE IRON AND STEEL INSTITUTE OF JAPAN | 1999年 / 85卷 / 05期

关键词：

EXAFS; EXEFS; EPMA; X-ray spectroscopy; microbeam analysis;

D O I：

暂无

中图分类号：

TF [冶金工业];

学科分类号：

0806 ;

摘要：

Fine structures in X-ray fluorescence spectra are explained from the view point of trace analysis. Among these fine structures, the physical processes of the X-ray Raman and radiative Auger effects are explained in detail. The similarity between the radiative Auger effect and X-ray absorption fine structures (XAFS) are described. A novel method to measure the XAFS spectra using the radiative Auger effect is explained; this method has been named EXEFS. Various numerical results of EXEFS Fourier analysis are described with the change of parameters in the numerical analysis. A potential of applying EXEFS method to microbeam analysis is reviewed.

引用

页码：353 / 361

页数：9

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