Electromigration occurences and its effects on metallic surfaces submitted to high electromagnetic field: A novel approach to breakdown in accelerators (vol 665, pg 54, 2011)

被引：10
作者：
Antoine, C. Z. [1 ]
Peauger, F. [1 ]
Le Pimpec, F. [2 ]
机构：
[1] CEA, SACM, Ctr Etud Saclay, F-91191 Gif Sur Yvette, France
[2] PSI, CH-5232 Villigen, Switzerland
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2012年 / 670卷
关键词：
SCANNING TUNNELING MICROSCOPE; LIQUID-METAL; ACTIVATION-ENERGY; ELECTRIC-FIELD; SELF-DIFFUSION; HIGH-TEMPERATURE; ION-SOURCE; TIP-SHAPE; EMISSION; COPPER;
D O I：
10.1016/j.nima.2012.01.027
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：79 / 94
页数：16
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