Investigation of the hemoglobin adsorption in porous silicon by the ellipsometry method

被引：1
|
作者：
Bolotov, V. V. [1 ]
Davletkil'deev, N. A. [1 ]
Korotenko, A. A. [1 ]
Mosur, E. Yu. [1 ]
Proskurina, O. Yu. [1 ]
Sten'kin, Yu. A. [1 ]
机构：
[1] Russian Acad Sci, Rzhanov Inst Semicond Phys, Omsk Branch, Siberian Branch, Omsk 644018, Russia
来源：
TECHNICAL PHYSICS | 2011年 / 56卷 / 07期
关键词：
Porous Silicon; Porous Layer; Spectroscopic Ellipsometry; Porous Silicon Layer; Hemoglobin Molecule;
D O I：
10.1134/S106378421107005X
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The hemoglobin adsorption in porous silicon is studied by the method of spectroscopic ellipsometry. The layer-by-layer component distribution in the porous silicon-hemoglobin system shows that hemoglobin molecules penetrate through the porous layer with a slight gradient of the protein volume fraction.
引用
收藏
页码：1053 / 1055
页数：3
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