Characterization of microstrip transmission lines at IR frequencies-modeling, fabrication and measurements

被引：13

作者：

Mandviwala, Tasneern A. ^{[2
,3
]}

Lail, Brian A. ^{[1
]}

Borernan, Glenn D. ^{[2
,3
]}

机构：

[1] Florida Inst Technol, Dept Elect & Comp Engn, Melbourne, FL 32901 USA

[2] Univ Cent Florida, Coll Opt & Photon, CREOL, Orlando, FL 32816 USA

[3] Univ Cent Florida, Coll Opt & Photon, FPCE, Orlando, FL 32816 USA

来源：

MICROWAVE AND OPTICAL TECHNOLOGY LETTERS | 2008年 / 50卷 / 05期

关键词：

infrared detectors; antennas; transmission line modeling; microstrip lines; transmission-line parameters;

D O I：

10.1002/mop.23344

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We report the complete characterization of microstrip lines at an infrared frequency of 28.3 THz (10.6-mu m wavelength) through modeling, fabrication, and measurement. The transmission-line parameters of interest can not be directly measured at infrared frequencies-the only measurable quantity is the voltage response of the antenna-coupled bolometric sensor. We validate the computational approach for transmission-line parameters by verifying the computed and measured response of the antenna connected to microstrip lines of different lengths. This also allows us to extend these calculations to explore various configurations and identify design trends. (C) 2008 Wiley Periodicals, Inc.

引用

页码：1232 / 1237

页数：6

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