The intensity of elastic and inelastic multiple scattering in EELS

被引：5
作者：
Cheng, SC
Wang, YY
Dravid, VP
机构：
[1] Dept. of Mat. Sci. and Engineering, Northwestern University, Evanston
来源：
MICRON | 1996年 / 27卷 / 02期
基金：
美国国家科学基金会;
关键词：
elastic scattering; inelastic scattering; multiple scattering; mean free path; electron energy loss spectroscopy; EELS;
D O I：
10.1016/0968-4328(96)00024-8
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
To evaluate the contribution of multiple scattering in momentum-resolved electron energy-loss spectroscopy, the angular dependence of the intensities of multiple scattering was investigated and compared with elastic and inelastic single-scattering profiles. From the experimental data the intensity ratio between multiple scattering and elastic scattering is derived. It can be used to estimate the contribution of multiply-scattered electrons in normal experimental conditions. Copyright (C) 1996 Elsevier Science Ltd.
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页码：167 / 170
页数：4
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