Accessing the robustness of adventitious carbon for charge referencing (correction) purposes in XPS analysis: Insights from a multi-user facility data review

被引:329
作者
Biesinger, Mark C. [1 ,2 ]
机构
[1] Univ Western Ontario, Surface Sci Western, 999 Collip Circle,Suite LL31, London, ON N6G 0J3, Canada
[2] Univ Western Ontario, Dept Chem, London, ON N6A 5B7, Canada
基金
加拿大自然科学与工程研究理事会;
关键词
X-ray photoelectron spectroscopy; XPS; Adventitious carbon; Binding energy reference; Charge referencing; C 1s peak; RAY PHOTOELECTRON-SPECTROSCOPY; AUGER PARAMETER; BINDING-ENERGY; WAGNER PLOT; CHEMICAL-STATES; NICKEL METAL; OXIDE;
D O I
10.1016/j.apsusc.2022.153681
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
An assessment of X-ray photoelectron spectroscopy (XPS) results from 1237 samples submitted to a multi-user facility from a five year period investigates the usage and effectiveness of common charge referencing methodologies for insulating samples. Carbon 1s (C 1s) starting peak-fitting routines for common graphitic-like materials and for adventitious carbon (AdC) are presented. An average adventitious carbon (AdC) C 1s binding energy of 284.91 eV (Std. Dev. 0.25 eV) was found for 117 samples that also contained a secondary charge reference possibility. With an understanding of the limits and possible issues with using AdC for charge referencing purposes and by incorporating other methodologies (Auger parameter, checks for data self-consistency, well-established peak-fitting routines) it was found that using AdC C 1s for charge referencing gave satisfactory and meaningful results in 95% of the 522 cases assessed. Differential charging is a common issue including in studies assessing AdC binding energies. This work demonstrates that electrical isolation (floating) of mixed insulating/semi-conducting/conducting samples significantly improves outcomes by mitigating differential charging issues.
引用
收藏
页数:11
相关论文
共 37 条
  • [1] Introduction to topical collection: Reproducibility challenges and solutions with a focus on guides to XPS analysis
    Baer, Donald R.
    McGuire, Gary E.
    Artyushkova, Kateryna
    Easton, Christopher D.
    Engelhard, Mark H.
    Shard, Alexander G.
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2021, 39 (02):
  • [2] XPS guide: Charge neutralization and binding energy referencing for insulating samples
    Baer, Donald R.
    Artyushkova, Kateryna
    Cohen, Hagai
    Easton, Christopher D.
    Engelhard, Mark
    Gengenbach, Thomas R.
    Greczynski, Grzegorz
    Mack, Paul
    Morgan, David J.
    Roberts, Adam
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2020, 38 (03):
  • [3] NATURE OF THE USE OF ADVENTITIOUS CARBON AS A BINDING-ENERGY STANDARD
    BARR, TL
    SEAL, S
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1995, 13 (03): : 1239 - 1246
  • [4] Beamson G., 1992, HIGH RESOLUTION XPS
  • [5] Advanced analysis of copper X-ray photoelectron spectra
    Biesinger, Mark C.
    [J]. SURFACE AND INTERFACE ANALYSIS, 2017, 49 (13) : 1325 - 1334
  • [6] The role of the Auger parameter in XPS studies of nickel metal, halides and oxides
    Biesinger, Mark C.
    Lau, Leo W. M.
    Gerson, Andrea R.
    Smart, Roger St. C.
    [J]. PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 2012, 14 (07) : 2434 - 2442
  • [7] Resolving surface chemical states in XPS analysis of first row transition metals, oxides and hydroxides: Cr, Mn, Fe, Co and Ni
    Biesinger, Mark C.
    Payne, Brad P.
    Grosvenor, Andrew P.
    Lau, Leo W. M.
    Gerson, Andrea R.
    Smart, Roger St. C.
    [J]. APPLIED SURFACE SCIENCE, 2011, 257 (07) : 2717 - 2730
  • [8] Resolving surface chemical states in XPS analysis of first row transition metals, oxides and hydroxides: Sc, Ti, V, Cu and Zn
    Biesinger, Mark C.
    Lau, Leo W. M.
    Gerson, Andrea R.
    Smart, Roger St. C.
    [J]. APPLIED SURFACE SCIENCE, 2010, 257 (03) : 887 - 898
  • [9] X-ray photoelectron spectroscopic chemical state quantification of mixed nickel metal, oxide and hydroxide systems
    Biesinger, Mark C.
    Payne, Brad P.
    Lau, Leo W. M.
    Gerson, Andrea
    Smart, Roger St. C.
    [J]. SURFACE AND INTERFACE ANALYSIS, 2009, 41 (04) : 324 - 332
  • [10] Chemical state determination of molecular gallium compounds using XPS
    Bourque, Jeremy L.
    Biesinger, Mark C.
    Baines, Kim M.
    [J]. DALTON TRANSACTIONS, 2016, 45 (18) : 7678 - 7696