A simple macromodeling approach for analysing substrate coupling in an RF mixer IC

被引：1
|
作者：
Li, L [1 ]
Li, ZY [1 ]
Tenhunen, H [1 ]
机构：
[1] Royal Inst Technol, KTH, Dept Microelect & Informat Technol, ESD Lab, SE-16440 Kista, Sweden
来源：
2003 5TH INTERNATIONAL CONFERENCE ON ASIC, VOLS 1 AND 2, PROCEEDINGS | 2003年
关键词：
D O I：
10.1109/ICASIC.2003.1277387
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
A circuit level substrate coupling noise(SCN) macromodel approach is proposed and applied to the tested mixer to investigate the interference of SCN through the four case studies. The results of these studies reveal that SCN current pulse width delta, and the spacing distance d of the contacts are two key factors and impact the third-order input-referred intercept point (IIP3) of a receiver mixer of the RF SoC.
引用
收藏
页码：1029 / 1032
页数：4
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