High resolution Fourier synthesis hard X-ray imaging based on CdTe strip detectors

被引:2
|
作者
Miyawaki, R
Niko, H
Okada, Y
Kokubun, M
Makishima, K
Negoro, H
Kotoku, J
Terada, Y
Tanaka, T
Mitani, T
Nakazawa, K
Takahashi, T
Ohno, R
Funaki, M
Kuroda, Y
Genba, K
Onishi, M
机构
[1] Univ Tokyo, Dept Phys, Tokyo 113, Japan
[2] RIKEN, Saitama, Japan
[3] Nihon Univ, Dept Phys, Tokyo, Japan
[4] Tokyo Inst Technol, Dept Phys, Tokyo 152, Japan
[5] ISAS, JAXA, Kanagawa, Japan
[6] ACRORAD Co Ltd, Okinawa, Japan
[7] Mitsubishi Heavy Ind Co Ltd, Aichi, Japan
关键词
CdTe; Fourier transforms; microstrip; X-ray astronomy detectors; X-ray imaging;
D O I
10.1109/TNS.2005.856885
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Employing Fourier-synthesis optics and one-dimensional position-sensitive detectors, we are developing a novel hard X-ray imager which can work in the similar to 10 keV to similar to 200 keV range either as a telescope or a microscope. As the detection part of our imager, we have developed a strip detector made of Schottky CdTe diode, with its cathode divided into 64 channels of 150 mu m pitch. Electrodes of all channels are gold-stud bonded to a fanout board, and connected to low noise analog ASIC. We read out signals from all channels simultaneously. As the grid optics elements, one-dimensional "modulation collimator" grids of 1 mm thick tungsten have been manufactured, with 10 grid pitches ranging from 0.2 mm to 2 mm with harmonic ratios. Combining the CdTe strip detector and the grids, we have verified hard X-ray imaging performance of this system. Using an Am-241 source, we have successfully obtained an image in the 10-70 keV range with a spatial resolution of similar to 0.5 mm.
引用
收藏
页码:2052 / 2057
页数:6
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