Passive film growth mechanism of nanocrystalline 304 stainless steel prepared by magnetron sputtering and deep rolling techniques

被引：100

作者：

Pan, Chen ^{[1
]}

Liu, Li ^{[1
]}

Li, Ying ^{[1
]}

Wang, Shenggang ^{[2
,3
]}

Wang, Fuhui ^{[1
]}

机构：

[1] Chinese Acad Sci, Inst Met Res, State Key Lab Corros & Protect, Shenyang 110016, Peoples R China

[2] Chinese Acad Sci, Shenyang Natl Lab Mat Sci, Inst Met Res, Shenyang 110016, Peoples R China

[3] Chinese Acad Sci, Int Ctr Mat Phys, Shenyang 110016, Peoples R China

来源：

ELECTROCHIMICA ACTA | 2011年 / 56卷 / 22期

关键词：

Nanocrystalline materials; In-situ AFM; Growth mechanism; IN-SITU; NUCLEATION; CORROSION; AFM;

D O I：

10.1016/j.electacta.2011.05.106

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

The passive film growth mechanisms of deep rolled bulk nanocrystalline (BN) 304ss and magnetron sputtered nanocrystalline (NC) 304ss thin film as well as that of the conventional rolled coarse crystalline (CC) 304ss has been studied by electrochemical measurements and in situ AFM observation in 0.05 M H2SO4 + 0.2 M NaCl solution. The growth of the passive film on all three materials was three-dimensional and the growth rates were, in decreasing order: NC thin film > BN 304ss > CC 304ss. Also, nanocrystallization caused the nucleation mechanism of the passive film to change from progressive to instantaneous. The passive films on the CC 304ss and BN 304ss displayed a monolayer structure while that on the NC thin film had a multi-layered structure. (C) 2011 Elsevier Ltd. All rights reserved.

引用

页码：7740 / 7748

页数：9

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