Excess noise in thick film piezoresistors on a metallic substrate

被引：3

作者：

Crescini, D ^{[1
]}

Marioli, D ^{[1
]}

Sardini, E ^{[1
]}

Taroni, A ^{[1
]}

机构：

[1] Univ Brescia, Fac Engn, Dept Elect Automat, I-25123 Brescia, Italy

来源：

MEASUREMENT SCIENCE AND TECHNOLOGY | 2001年 / 12卷 / 05期

关键词：

excess noise; thick-firm piezoresistors; noise measurement; metallic substrates;

D O I：

10.1088/0957-0233/12/5/305

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The excess-noise behaviours of thick-film piezoresistors printed on metallic substrates and on alumina substrates are compared. The results obtained show that the excess noise is similar in both cases depending on the volume and on the refiring cycles, as reported in the literature for resistors on alumina substrates. The paper gives a detailed description of the method of measurement and instrumentation, in particular, of the low noise pre-amplifiers.

引用

页码：582 / 588

页数：7

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