Adhesion between template materials and UV-cured nanoimprint resists

被引:61
作者
Houle, F. A.
Guyer, Eric
Miller, D. C.
Dauskardt, Reinhold
机构
[1] IBM Corp, Almaden Res Ctr, San Jose, CA 95120 USA
[2] Stanford Univ, Dept Mat Sci & Engn, Stanford, CA 94305 USA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2007年 / 25卷 / 04期
关键词
D O I
10.1116/1.2746336
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Defects in polymeric lithographic stencils fabricated by the UV-cured nanoimprint technique result from fundamental surface interactions between template and resist in addition to the presence of particles and contaminants. Repeated and molecularly clean separations of the template from the cured resist are a requirement for successful application of the imprint method yet little is understood about their dependence on interfacial physics and chemistry. The process of interfacial separation of several model acrylate nanoimprint resist formulations cured in contact with clean (no release treatment) and release-treated silica glass surfaces has been quantitatively investigated. The results show that interfacial fracture energies are resist formulation dependent, that the resist-release layer systems studied are not chemically stable and that the release process is more complex than simple fracture at a glass-organic interface.
引用
收藏
页码:1179 / 1185
页数:7
相关论文
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