Surface, interface and bulk studies of NiFe nanometer films for magnetoresistive heads

被引:24
作者
Hollingworth, MP [1 ]
Gibbs, MRJ
Hill, EW
机构
[1] Univ Sheffield, Dept Phys & Astron, Sheffield S3 7RH, S Yorkshire, England
[2] Univ Manchester, Dept Comp Sci, Manchester M13 9PL, Lancs, England
关键词
D O I
10.1063/1.1543874
中图分类号
O59 [应用物理学];
学科分类号
摘要
Polycrystalline Ni81Fe19 films have been vapor-deposited in a forming field onto a 100-mum-thick borosilicate glass. The free surface and film/substrate interface magnetization has been probed using magneto-optical Kerr effect (MOKE) magnetometry, and bulk measurements have been taken using an alternating gradient force magnetometer. Saturation magnetostriction constants were derived from the strain dependence of the anisotropy field in the MOKE measurements, separating out for the first time free surface and interface effects. The free surface showed a clear uniaxial anisotropy with a low dispersion, while the interface showed a mixture of domain switching and moment rotation. We interpret the data in terms of a gradient in magnetic properties through the sample, and discuss consequences for magnetoresistive heads. (C) 2003 American Institute of Physics.
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页码:8737 / 8739
页数:3
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