Coherent light 3D materials microscopy without phase retrieval

被引：0

作者：

Xing, Jian ^{[1
]}

Yu, Jiun-Yann ^{[1
]}

Chen, Simeng ^{[1
]}

Cogswell, Carol ^{[1
]}

机构：

[1] Univ Colorado, Dept Elect Comp & Energy Engn, 425 UCB, Boulder, CO 80309 USA

来源：

THREE-DIMENSIONAL AND MULTIDIMENSIONAL MICROSCOPY: IMAGE ACQUISITION AND PROCESSING XXIV | 2017年 / 10070卷

关键词：

3D materials inspection; PSF engineering; phase retrieval; super-resolution; coherent illumination;

D O I：

10.1117/12.2272800

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

We report a novel microscopy technique, utilizing our previously reported expanded point information content (EPIC) concept [1], to extend the technique into the coherent regime. Preliminary data shows coherent EPIC (CoEPIC) can image reflective samples successfully, and can recover the 3D structure without the need to acquire an image stack at multiple depths. Numerical simulation demonstrates the potential super-resolution capability of CoEPIC.

引用

页数：4

共 2 条

[1] A new expanded point information content design approach for 3D live-cell microscopy at video rates
Zahreddine, Ramzi N.
Cormack, Robert H.
Cogswell, Carol J.
[J]. THREE-DIMENSIONAL AND MULTIDIMENSIONAL MICROSCOPY: IMAGE ACQUISITION AND PROCESSING XX, 2013, 8589
[2] Detecting 20 nm Wide Defects in Large Area Nanopatterns Using Optical Interferometric Microscopy
Zhou, Renjie
Edwards, Chris
Arbabi, Amir
Popescu, Gabriel
Goddard, Lynford L.
[J]. NANO LETTERS, 2013, 13 (08) : 3716 - 3721

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