Evaluation of charging on macromolecules in electron cryomicroscopy

被引:65
|
作者
Brink, J
Sherman, MB
Berriman, J
Chiu, W
机构
[1] Baylor Coll Med, Natl Ctr Macromol Imaging, Verna & Marrs Mclean Dept Biochem, Houston, TX 77030 USA
[2] MRC, Mol Biol Lab, Cambridge CB2 2QH, England
关键词
imaging charged samples; cryomicroscopy; defocused diffraction; secondary electron emission; electrical breakdown; specimen current;
D O I
10.1016/S0304-3991(97)00126-5
中图分类号
TH742 [显微镜];
学科分类号
摘要
We describe procedures to assess charging of biological specimens under electron irradiation in an electron cryomicroscope. Charging can be observed by an expansion of the illuminating beam, blurring of electron diffraction patterns and by beam "footprints" on the specimen. Discharging can also be seen in the defocused electron diffraction mode. We investigated the influence of a variety of Factors on the magnitude and visibility of charging. A reduction of charging is noticed when part of the adjacent carbon him is included in the irradiated specimen area. (C) 1998 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:41 / 52
页数:12
相关论文
共 35 条
  • [21] Electron emission yield and charging process of alkali-silicate glass submitted to an electron beam under the varying temperature condition
    Belhaj, M.
    Tondu, T.
    Inguimbert, V.
    Elsafi, B.
    Fakhfakh, S.
    Jbara, O.
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2012, 270 : 120 - 127
  • [22] Modelling and observations of electron beam charging of an insulator/metal bilayer and its impact on secondary electron images in defect inspection equipment
    Ohya, Kaoru
    Inai, Kensuke
    Kawasaki, Ryosuke
    Saito, Misako
    Hayashi, Teruyuki
    Jau, Jack
    Kanai, Kenichi
    JOURNAL OF ELECTRON MICROSCOPY, 2010, 59 : S189 - S193
  • [23] Low-Energy Electron Beam Induced Charging and Secondary Electron Emission Properties of FEP Film Used on Satellite Surfaces
    Fujii, Haruhisa
    Okumura, Teppei
    Takahashi, Masato
    ELECTRICAL ENGINEERING IN JAPAN, 2014, 188 (01) : 9 - 17
  • [24] Influence of ion implantation and electron pre-irradiation on charging of dielectrics under electron beam irradiation: Application to SiO2
    Rau, E. I.
    Tatarintsev, A. A.
    Zykova, E. Yu.
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2019, 460 : 141 - 146
  • [25] Dynamic evolution investigation on the dielectric surface charging under electron irradiation with various energy distributions
    Wang, Jiyuan
    Xu, Yanan
    Lian, Zhuoxi
    Wang, Dan
    Meng, Xiangchen
    Zhou, Nan
    He, Yongning
    RESULTS IN PHYSICS, 2024, 57
  • [26] Electron-beam-induced charging of an Al2O3 nanotip studied using off-axis electron holography
    Zheng, Fengshan
    Beleggia, Marco
    Migunov, Vadim
    Pozzi, Giulio
    Dunin-Borkowski, Rafal E.
    ULTRAMICROSCOPY, 2022, 241
  • [27] Comparison of charging phenomena under electron beam of m-ZrO2 and yttria stabilized zirconia
    Boughariou, Aicha
    Jaber, Hawra Hedi
    Blaise, Guy
    RUSSIAN PHYSICS JOURNAL, 2025,
  • [28] Helium ion beam induced electron emission from insulating silicon nitride films under charging conditions
    Petrov, Yu. V.
    Anikeva, A. E.
    Vyvenko, O. F.
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2018, 425 : 11 - 17
  • [29] Roughness Evolution and Charging in Plasma-Based Surface Engineering of Polymeric Substrates: The Effects of Ion Reflection and Secondary Electron Emission
    Memos, George
    Lidorikis, Elefterios
    Kokkoris, George
    MICROMACHINES, 2018, 9 (08):
  • [30] Electron beam charging of a SiO2 layer on Si: a comparison between Monte Carlo-simulated and experimental results
    Inai, Kensuke
    Ohya, Kaoru
    Kuwada, Hideaki
    Kawasaki, Ryosuke
    Saito, Misako
    Fujihara, Kaoru
    Hayashi, Teruyuki
    Jau, Jack
    Kanai, Kenichi
    LITHOGRAPHY ASIA 2008, 2008, 7140