Edge detection based on the wavelet analysis

被引：0

作者：

Ha Yan ^{[1
]}

Wang Xiaofei ^{[1
]}

机构：

[1] Hebei Univ, Coll Phys Sci & Technol, Baoding 071002, Peoples R China

来源：

2008 INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY: OPTICAL SYSTEMS AND OPTOELECTRONIC INSTRUMENTS | 2009年 / 7156卷

关键词：

Edge detection; Wavelet analysis; The best threshold;

D O I：

10.1117/12.811780

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Edge detection is one of the most basic contents in image processing and identification and plays an important role in the image processing. A new edge detection method based on the multi-scale of wavelet analysis and improving the image segmentation of the best threshold is proposed. The characteristics of this new edge detection operator have been analyzed in this paper. The advantages and disadvantages between the new operator and those traditional edge detection operators have also been discussed.

引用

页数：6

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