High-order birefringence measurement using spectroscopic polarized light

被引：4

作者：

Kowa, H ^{[1
]}

Muraki, K ^{[1
]}

Otani, Y ^{[1
]}

Umeda, N ^{[1
]}

Yoshizawa, T ^{[1
]}

机构：

[1] Tokyo Univ Agr & Technol, Koganei, Tokyo 1848588, Japan

来源：

POLARIZATION ANALYSIS, MEASUREMENT, AND REMOTE SENSING III | 2000年 / 4133卷

关键词：

high-order birefringence measurement; spectroscopic; acousto-optic tunable filter;

D O I：

10.1117/12.406620

中图分类号：

TP7 [遥感技术];

学科分类号：

081102 ; 0816 ; 081602 ; 083002 ; 1404 ;

摘要：

The paper covers an issue of method and device for measurement of two-dimensional retardance with high-order and azimuthal direction. The system based on the use of a crossed polarizer by changing spectroscopic polarized light Sixty-four sets of images are used for birefringence analysis. The spectroscopic interferogram change sinusoidal with wave number and the period is in proportion to birefringence of specimen. The measured results of the two dimensional birefringence distribution of a plastic and standard phase plate of retardation are shown. Fourier transform method and maximum entropy method enable to measure birefringence with high resolution. Two examples, measurement of aligned polymer film, which is laminated as steps, and that of birefringence distribution, are demonstrated.

引用

页码：134 / 137

页数：4

共 8 条

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