A 250-ps time-resolution CMOS multihit time-to-digital converter for nuclear physics experiments

被引：18

作者：

Bigongiari, F ^{[1
]}

Roncella, R ^{[1
]}

Saletti, R ^{[1
]}

Terreni, P ^{[1
]}

机构：

[1] Univ Pisa, Dipartimento Ingn Informaz, I-56126 Pisa, Italy

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1999年 / 46卷 / 02期

关键词：

application specific integrated circuit; delay lines; delay lock loop; time measurements;

D O I：

10.1109/23.757192

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper presents a CMOS realization of a time-to-digital converter (TDC) for nuclear physics experiments. An innovative and robust architecture, already used in a previous TDC version with 1 ns of bin size, has been adopted and improved with the aim to achieve a 500-ps bin size. The TDC has eight input channels plus a common channel. It can store up to 32 events per channel with a double-hit resolution of 8 ns. It can realize common-start and common-stop operations. It has 4.2 ms of input range with a 125-MHz system clock, The chip uses an asynchronous interpolator system based on a delay-locked Line to increase the coarse resolution. It has been fabricated in a double-metal single poly n-well, 1-mu m CMOS process with an area of about 77 mm(2). Measurements show that the TDC has better performance compared to similar devices, especially the time resolution below 250 ps.

引用

页码：73 / 77

页数：5

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