Room-temperature continuous-wave electrically injected InGaN-based laser directly grown on Si

被引:222
|
作者
Sun, Yi [1 ,2 ]
Zhou, Kun [1 ]
Sun, Qian [1 ]
Liu, Jianping [1 ]
Feng, Meixin [1 ]
Li, Zengcheng [1 ]
Zhou, Yu [1 ]
Zhang, Liqun [1 ]
Li, Deyao [1 ]
Zhang, Shuming [1 ]
Ikeda, Masao [1 ]
Liu, Sheng [3 ]
Yang, Hui [1 ]
机构
[1] Chinese Acad Sci, Suzhou Inst Nanotech & Nanobion SINANO, Key Lab Nanodevices & Applicat, Suzhou 215123, Peoples R China
[2] Huazhong Univ Sci & Technol, Sch Opt & Elect Informat, Wuhan 430074, Peoples R China
[3] Wuhan Univ, Sch Power & Mech Engn, Wuhan 430072, Peoples R China
基金
中国国家自然科学基金; 中国博士后科学基金;
关键词
X-RAY-DIFFRACTION; EPITAXIAL LAYERS; GAN; SILICON; DIODES; DEGRADATION; RELAXATION; OPERATION; LIGHT;
D O I
10.1038/nphoton.2016.158
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Silicon photonics would greatly benefit from efficient, visible on-chip light sources that are electrically driven at room temperature(1,2). To fully utilize the benefits of large-scale, low-cost manufacturing foundries, it is highly desirable to grow direct bandgap III-V semiconductor lasers directly on Si3-5. Here, we report the demonstration of a blue-violet (413 nm) InGaN-based laser diode grown directly on Si that operates under continuous-wave current injection at room temperature, with a threshold current density of 4.7 kA cm(-2). The heteroepitaxial growth of GaN on Si is confronted with a large mismatch in both the lattice constant and the coefficient of thermal expansion, often resulting in a high density of defects and even microcrack networks. By inserting an Al-composition step-graded AIN/AIGaN multilayer buffer between the Si and GaN, we have not only successfully eliminated crack formation, but also effectively reduced the dislocation density. The result is the realization of a blue-violet InGaN-based laser on Si.
引用
收藏
页码:595 / 599
页数:5
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