Berry-phase interpretation of thin-film micromagnetism

被引：1

作者：

Skomski, R. ^{[1
]}

Balasubramanian, B.

Ullah, A.

Binek, C.

Sellmyer, D. J.

机构：

[1] Univ Nebraska, Dept Phys & Astron, Lincoln, NE 68588 USA

来源：

AIP ADVANCES | 2022年 / 12卷 / 03期

基金：

美国国家科学基金会;

关键词：

Thin films;

D O I：

10.1063/9.0000332

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Magnetic flux densities (B-fields) and field intensities (H-fields) in thin films are investigated from the viewpoints of Berry phase and topological Hall effect. The well-known origin of the topological Hall effect is an emergent B-field originating from the Berry phase of conduction electrons, but Maxwell's equations predict the relevant perpendicular component B, to be zero. This paradox is solved by treating the electrons as point-like objects in Lorentz cavities. These cavities can also be used to interpret magnetization measurements in the present and other contexts, but structural and magnetic inhomogeneities lead to major modifications of the Lorentz-hole picture. (C) 2022 Author(s).

引用

页数：4

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