Impact-ionization wave breakdown and generation of picosecond pulses in the ultrahigh-frequency band in GaAs drift step-recovery diodes

被引:2
|
作者
Kozlov, VA [1 ]
Rozhkov, AV [1 ]
Kardo-Sysoev, AF [1 ]
机构
[1] Russian Acad Sci, AF Ioffe Physicotech Inst, St Petersburg 194021, Russia
关键词
GaAs; Magnetic Material; Electromagnetism; Short Pulse; Semiconductor Device;
D O I
10.1134/1.1634667
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
It is shown experimentally for the first time that the operation of GaAs drift step-recovery diodes produced on the basis of p(+)-p(0)-n(0)-n(+) is accompanied by the generation of ultrahigh-frequency oscillations in the form of trains of short pulses with a duration of similar to10 ps. The amplitude and repetition frequency of these pulses are as high as similar to100 V and similar to(10-100) GHz, respectively. The phenomena of delayed reversible wave breakdown and excitation of ultrahigh-frequency oscillations in the structures of GaAs step-recovery diodes are found to open up new avenues for progress both in the physics and technology of semiconductor devices based on GaAs structures and in the technology of ultrahigh-frequency systems and devices that deal with pulsed signals of picosecond-scale duration. (C) 2003 MAIK "Nauka / Interperiodica".
引用
收藏
页码:1428 / 1429
页数:2
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  • [1] Impact-ionization wave breakdown and generation of picosecond pulses in the ultrahigh-frequency band in GaAs drift step-recovery diodes
    V. A. Kozlov
    A. V. Rozhkov
    A. F. Kardo-Sysoev
    Semiconductors, 2003, 37 : 1428 - 1429
  • [2] Impact ionization wave breakdown of drift step recovery diodes
    Kozlov, VA
    Kardo-Sysoev, AF
    Brylevskii, VI
    SEMICONDUCTORS, 2001, 35 (05) : 608 - 611
  • [3] Impact ionization wave breakdown of drift step recovery diodes
    V. A. Kozlov
    A. F. Kardo-Sysoev
    V. I. Brylevskii
    Semiconductors, 2001, 35 : 608 - 611