Analysis of the scattered light distribution of a tightly focused laser beam by a particle near a substrate

We present a calculation method to analyze the scattered electromagnetic field by a particle near a substrate. The method is based on the iterative calculations of the extended Mie scattering theory [J. P. Barton, D. R. Alexander, and S. A. Schaub, J. Appl. Phys. 64, 1632 (1988)] and of plane-wave decompositions in order to include the multi-scattering between the particle and the substrate. The method is applicable to an arbitrary incident beam and an arbitrary distance between the particle and the substrate. It is possible to analyze the interaction between a particle and a multilayered substrate. We present the electromagnetic field distribution when the particle near the substrate is illuminated with focused laser beam. (C) 2001 American Institute of Physics.