Development of Delphi-Type Compact Thermal Models for Opto-Electronic Packages

被引:1
|
作者
Raghupathy, Arun Prakash [1 ]
Janssen, John
Aranyosi, Attila [1 ]
Ghia, Urmila [2 ]
Ghia, Karman [3 ]
Maltz, William [1 ]
机构
[1] Elect Cooling Solut Inc, Santa Clara, CA 95051 USA
[2] Univ Cincinnati, Dept Mech Engn, Computat Fluid Dynam Res Lab, Cincinnati, OH 45221 USA
[3] Univ Cincinnati, Dept Aerosp Engn, Computat Fluid Dynam Res Lab, Cincinnati, OH 45221 USA
关键词
DELPHI; multisource; DOTCOMP; compact thermal model; boundary-condition independent models; ELECTRONIC PARTS; SPECIAL SECTION;
D O I
10.1115/1.4003217
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In the current study, a network-based resistor model has been developed for thermal analysis of a complex opto-electronic package called small form-factor pluggable device (SFP). This is done using the DEvelopment of Libraries of PHysical models for an Integrated design (DELPHI) methodology. The SFP is an optical transceiver widely used in telecommunication equipments such as switches and routers. The package has a detailed construction and typically has four fixed heat generating sources. The detailed model for the SFP is constructed and calibrated using a natural convection experiment. The calibrated detailed model is used for generating the limited boundary-condition-independent compact thermal model (CTM). Limited boundary-condition-independence, in this case, refers only to a small subset of all "thinkable" boundary conditions that are experienced by the SFP device in practical situations. The commercial optimization tool developed by the DELPHI team, DOTCOMP, is used for generating the compact thermal model. A detailed validation of the CTM of the SFP in real-time applications using FLOTHERM 7.2, a computational fluid dynamics-based thermal analysis software package, is performed. The results show excellent agreement between the results predicted by the SFP CTM with the data from the detailed model. The SFP CTM predicts the junction temperature of the four power-dissipating components and the heat flows through the sides with relative error less than 10%. [DOI: 10.1115/1.4003217]
引用
收藏
页数:10
相关论文
共 50 条
  • [1] DEVELOPMENT OF BOUNDARY CONDITION INDEPENDENT COMPACT THERMAL MODELS FOR OPTO-ELECTRONIC PACKAGES
    Raghupathy, Arun Prakash
    Aranyosi, Attila
    Ghia, Urmila
    Ghia, Karman
    maltz, William
    IPACK 2009: PROCEEDINGS OF THE ASME INTERPACK CONFERENCE 2009, VOL 2, 2010, : 741 - 751
  • [2] Thermal Analysis of Opto-Electronic Packages - the Delphi-Based Compact Thermal Model and Other Modeling Practices in the Industry
    Raghupathy, Arun P.
    Shen, Jun
    26TH ANNUAL IEEE SEMICONDUCTOR THERMAL MEASUREMENT AND MANAGEMENT SYMPOSIUM, PROCEEDINGS 2010, 2010, : 264 - +
  • [3] Development and evaluation of a new type of opto-electronic dendrometer
    Yoda, K
    Suzuki, M
    Suzuki, H
    IAWA JOURNAL, 2000, 21 (04) : 425 - 434
  • [4] Development of opto-electronic material
    Ma, Bing
    Ren, Qian
    Guangxue Jishu/Optical Technique, 1995, (06): : 36 - 39
  • [5] Optical measurements for micro- and opto-electronic packages/substrates
    Han, Lei
    Voloshin, Arkady
    Pearson, Ray
    Proceedings of the Seventh IEEE CPMT Conference on High Density Microsystem Design, Packaging and Failure Analysis (HDP'05), 2005, : 385 - 389
  • [6] MODELS AND MECHANISM OF OPTO-ELECTRONIC MOLECULAR DEVICES
    韦钰
    顾忠泽
    Journal of Southeast University(English Edition), 1992, (02) : 1 - 10
  • [7] Improving thermal stability of opto-electronic oscillators
    Li, H-W
    Daryoush, A. S.
    Vilcot, J-P
    Decoster, D.
    Chazelas, J.
    Bouwmans, G.
    Quiquempois, Y.
    Deborgies, E.
    IEEE MICROWAVE MAGAZINE, 2006, 7 (04) : 38 - 47
  • [8] Integrating compact thermal models in CFD simulations of electronic packages
    Gupta, Rohit Dev
    Eswaran, Vinayak
    JOURNAL OF ELECTRONIC PACKAGING, 2008, 130 (02) : 0210021 - 0210029
  • [9] Numerical solution methodology for Compact Thermal Models of electronic packages
    Gupta, Rohit Dev
    Eswaran, Vinayak
    PROCEEDINGS OF THE ASME/JSME THERMAL ENGINEERING SUMMER HEAT TRANSFER CONFERENCE 2007, VOL 2, 2007, : 719 - 726
  • [10] Thermal characterization of chip packages - Evolutionary development of compact models
    Bar-Cohen, A
    Krueger, WB
    IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY PART A, 1997, 20 (04): : 399 - 410