Mean estimate for Shewhart-chart-monitored processes subject to random shifts
被引:0
作者:
Chen, A
论文数: 0引用数: 0
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机构:
Natl Taiwan Univ, Grad Inst Ind Engn, Taipei 106, TaiwanNatl Taiwan Univ, Grad Inst Ind Engn, Taipei 106, Taiwan
Chen, A
[1
]
Elsayed, EA
论文数: 0引用数: 0
h-index: 0
机构:
Natl Taiwan Univ, Grad Inst Ind Engn, Taipei 106, TaiwanNatl Taiwan Univ, Grad Inst Ind Engn, Taipei 106, Taiwan
Elsayed, EA
[1
]
机构:
[1] Natl Taiwan Univ, Grad Inst Ind Engn, Taipei 106, Taiwan
来源:
1998 IEEE INTERNATIONAL CONFERENCE ON SYSTEMS, MAN, AND CYBERNETICS, VOLS 1-5
|
1998年
关键词:
D O I:
暂无
中图分类号:
TP3 [计算技术、计算机技术];
学科分类号:
0812 ;
摘要:
The Shewhart control chart is a widely used statistical control tool that helps detect a possible process shift (out-of-control process). Though the Shewhart chart is in theory a monitoring tool that reveals only the result of a hypothesis testing. in practice the chart's signaling is often used as the evidence for making process adjustment. In this paper. wt: develop a process mean estimator for processes monitored by Shewhart charts. This mean estimate can serve: as an important reference for investigating assignable causes and taking appropriate corrective actions. A semiconductor fabrication process will he used as an example to illustrate the methodology.