Corroded surface roughness of copper analyzed by Fourier transform infrared mapping microscopy and optical profilometric study

被引:2
作者
Kasperek, J [1 ]
Lefez, B
Beucher, E
机构
[1] Univ Rouen, Inst Mat, LASTSM, UPRES EA 1290, F-76801 St Etienne, France
[2] CRITT Anal & Surface, F-27400 Louviers, France
关键词
Fourier transform infrared; FT-IR mapping microscopy; roughness; copper; atacamite; clinoatacamite;
D O I
10.1366/000370204322842904
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
This study shows the effects of roughness on infrared spectra shapes of thin corrosion products on metallic substrates. The calculated spectra show that the baseline is mainly affected by increasing roughness and that such effects do not shift the position of the absorption bands. The model obtained has been used to extract data of artificial patina on a copper surface. Surface defects of copper substrates can be distinguished on the whole surface, from the morphological and chemical points of view, using optical profilometry and infrared microspectroscopy. An homogeneous layer of cuprite covers the surface except in the linear defects. Fourier transform infrared (FT-IR) analysis indicates that a mixture of atacamite and clinoatacamite is mainly located in these scratchs. The width of these particular areas is in good agreement with profilometric observations.
引用
收藏
页码:179 / 183
页数:5
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