Modeling and Design of FTJs']Js as Multi-Level Low Energy Memristors for Neuromorphic Computing

被引:17
作者
Fontanini, Riccardo [1 ]
Segatto, Mattia [1 ]
Massarotto, Marco [1 ]
Specogna, Ruben [1 ]
Driussi, Francesco [1 ]
Loghi, Mirko [1 ]
Esseni, David [1 ]
机构
[1] Univ Udine, DPIA, I-33100 Udine, Italy
来源
IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY | 2021年 / 9卷
关键词
Ferroelectric tunnelling junctions; depolarization field; charge trapping; tunneling electron resistance; neuromorphic computing; FERROELECTRIC PROPERTIES; SIMULATION;
D O I
10.1109/JEDS.2021.3120200
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
An in-house modeling framework for Ferroelectric Tunnelling Junctions (FTJ) is here presented in details. After a precise calibration again experiments, the model is exploited for an insightful study of the design of FTJs as synaptic devices for neuromorphic networks. Our analysis explains and addresses the tradeoff between the reading efficiency and the effects of the depolarization field during the retention phase. The reported results show that a moderately low-k tunnelling dielectric (e.g., SiO2) can increase the read current and the current dynamic range. The study shows also how the contribution of trapped charge may favor the stabilization of the polarization inside the FTJ, but also reduces the maximum read current.
引用
收藏
页码:1202 / 1209
页数:8
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