A General Purpose Approximate Goodness-of-Fit Test for Progressively Type-II Censored Data

被引:75
作者
Pakyari, Reza [1 ]
Balakrishnan, N. [2 ]
机构
[1] Arak Univ, Dept Math, Fac Sci, Arak 3815688349, Iran
[2] McMaster Univ, Dept Math & Stat, Hamilton, ON L8S 4K1, Canada
关键词
Anderson-Darling statistic; Cramer-von Mises statistic; empirical distribution function; hypothesis testing; Kolmogorov-Smirnov statistic; Monte Carlo simulation; progressive Type-II censoring; INTERVAL ESTIMATION; EXPONENTIALITY; PARAMETERS; STATISTICS; SPACINGS;
D O I
10.1109/TR.2012.2182811
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
We propose a general purpose approximate goodness-of-fit test that covers several families of distributions under progressive Type-II censored data. The test procedure is based on the empirical distribution function (EDF), and generalizes the goodness-of-fit test proposed by Chen and Balakrishnan [11] to progressively Type-II censored data. The new method requires some tables for critical values, which are constructed by Monte Carlo simulation. The power of the proposed tests are then assessed for several alternative distributions, while testing for normal, Gumbel, and log-normal distributions, through Monte Carlo simulations. It is observed that the proposed tests are quite powerful when compared to an existing goodness-of-fit test proposed for progressively Type-II censored data due to Balakrishnan et al. [8]. The proposed goodness-of-fit test is then illustrated with two real data sets.
引用
收藏
页码:238 / 244
页数:7
相关论文
共 24 条
[1]   GOODNESS-OF-FIT TESTS FOR THE WEIBULL DISTRIBUTION WITH UNKNOWN-PARAMETERS AND CENSORED SAMPLING [J].
AHO, M ;
BAIN, LJ ;
ENGELHARDT, M .
JOURNAL OF STATISTICAL COMPUTATION AND SIMULATION, 1983, 18 (01) :59-69
[2]  
[Anonymous], 1986, GOODNESS OF FIT TECH
[3]  
[Anonymous], 1986, Statistics: Textbooks and Monographs, Vol. 68
[4]   Progressive censoring methodology: an appraisal [J].
Balakrishnan, N. .
TEST, 2007, 16 (02) :211-259
[5]   A SIMPLE SIMULATIONAL ALGORITHM FOR GENERATING PROGRESSIVE TYPE-II CENSORED SAMPLES [J].
BALAKRISHNAN, N ;
SANDHU, RA .
AMERICAN STATISTICIAN, 1995, 49 (02) :229-230
[6]   Goodness-of-fit tests based on Spacings for progressively type-II censored data from a general location-scale distribution [J].
Balakrishnan, N ;
Ng, HKT ;
Kannan, N .
IEEE TRANSACTIONS ON RELIABILITY, 2004, 53 (03) :349-356
[7]   On the distribution of a test for exponentiality based on progressively Type-II right censored spacings [J].
Balakrishnan, N ;
Lin, CT .
JOURNAL OF STATISTICAL COMPUTATION AND SIMULATION, 2003, 73 (04) :277-283
[8]   Point and interval estimation for Gaussian distribution, based on progressively Type-II censored samples [J].
Balakrishnan, N ;
Kannan, N ;
Lin, CT ;
Ng, HKT .
IEEE TRANSACTIONS ON RELIABILITY, 2003, 52 (01) :90-95
[9]  
Balakrishnan N, 2002, STAT IND TECHNOL, P89
[10]   Testing exponentiality based on Kullback-Leibler information with progressively Type-II censored data [J].
Balakrishnan, Narayanaswamy ;
Rad, Arezou Habibi ;
Arghami, Naser Reza .
IEEE TRANSACTIONS ON RELIABILITY, 2007, 56 (02) :301-307