The annealing of La0.67Sr0.33MnO3 polycrystalline films

被引：0

作者：

Xu, QY ^{[1
]}

Gu, KM

Tang, T

Ni, G

Wang, ZM

Sang, H

Du, YW

机构：

[1] Nanjing Univ, Natl Lab Solid State Microstruct, Nanjing 210093, Peoples R China

[2] Nanjing Univ, Ctr Adv Studies Sci & Technol Microstruct, Nanjing 210093, Peoples R China

来源：

JOURNAL OF MATERIALS SCIENCE LETTERS | 2001年 / 20卷 / 14期

基金：

中国国家自然科学基金;

关键词：

D O I：

10.1023/A:1010946401115

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Polycrystalline films of lanthanum compounds were fabricated using magnetron sputtering and were studied under different annealing temperatures. X-ray diffraction analysis indicated better crystallization of films with increasing temperature. Electrical resistivity dropped on increasing the temperature to 500 °C. The resistivity remained unchanged while magnetoresistance increased above 500 °C.

引用

页码：1317 / 1318

页数：2

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