Polished Nanopipets: New Probes for High-Resolution Scanning Electrochemical Microscopy

被引：35

作者：

Elsamadisi, Pansy ^{[1
]}

Wang, Yixian ^{[1
]}

Velmurugan, Jeyavel ^{[1
]}

Mirkin, Michael V. ^{[1
]}

机构：

[1] CUNY Queens Coll, Dept Chem & Biochem, Flushing, NY 11367 USA

来源：

ANALYTICAL CHEMISTRY | 2011年 / 83卷 / 03期

基金：

美国国家科学基金会;

关键词：

LIQUID-LIQUID INTERFACE; NANOSCOPIC LIQUID/LIQUID INTERFACES; FACILITATED ION TRANSFER; ELECTRON-TRANSFER; TRANSFER KINETICS; SECM; WATER;

D O I：

10.1021/ac102704z

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

Nanometer-sized pipets pulled from glass or quartz capillaries have been extensively used as probes for scanning electrochemical microscopy (SECM) and scanning ion conductance microscopy (SICM). A small separation distance between such a probe and the sample, which is required for high-resolution SECM measurements, may be hard to attain because of considerable roughness of the pipet tip. In this Letter, we report the preparation and characterization of polished nanopipet SECM probes with a much smoother tip edge, Using polished pipets; quantitative SECM measurements were performed at extremely short tip/substrate distances (e.g., d approximate to 1 nm).

引用

页码：671 / 673

页数：3

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