Influence of growth temperature on critical current and magnetic flux pinning structures in YBa2Cu3O7-x

被引:37
作者
Feldmann, D. M. [1 ]
Ugurlu, O. [1 ]
Maiorov, B. [1 ]
Stan, L. [1 ]
Holesinger, T. G. [1 ]
Civale, L. [1 ]
Foltyn, S. R. [1 ]
Jia, Q. X. [1 ]
机构
[1] Los Alamos Natl Lab, Los Alamos, NM 87545 USA
关键词
D O I
10.1063/1.2799875
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have studied the critical current density (J(c)) as a function of applied magnetic field (H) magnitude and orientation for similar to 1-mu m-thick YBa2Cu3O7-x films grown by pulsed laser deposition at growth temperatures (T-g) from 730 to 870 degrees C. With changing T-g, alternately a high density of planar defects (YBa2Cu4Ox intergrowths) or columnar defects (Y-Cu-O nanocolumns) are introduced. These defects produce a maximum for J(c)(H similar to 1 T) parallel to the plane of the film or the film normal, respectively. For T-g >= 830 degrees C, we present evidence of a Ba-Cu-O liquid phase during growth, which results in a dramatic change in both the microstructure of the films and magnetic field orientation dependence of J(c). (C) 2007 American Institute of Physics.
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