The morphological, optical and electrical properties of SnO2:F thin films prepared by spray pyrolysis
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作者:
Zhi, Xiao
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Xian Univ Technol, Adv Mat Anal Ctr, Xian 710048, Shaanxi, Peoples R China
Xian Univ Technol, Sch Mat Sci & Engn, Xian 710048, Shaanxi, Peoples R China
China Luoyang Float Glass Grp Co Ltd, Luoyang 471009, Henan, Peoples R ChinaXian Univ Technol, Adv Mat Anal Ctr, Xian 710048, Shaanxi, Peoples R China
Zhi, Xiao
[1
,2
,3
]
Zhao, Gaoyang
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Xian Univ Technol, Sch Mat Sci & Engn, Xian 710048, Shaanxi, Peoples R ChinaXian Univ Technol, Adv Mat Anal Ctr, Xian 710048, Shaanxi, Peoples R China
Zhao, Gaoyang
[2
]
Zhu, Tao
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Xian Univ Technol, Sch Mat Sci & Engn, Xian 710048, Shaanxi, Peoples R ChinaXian Univ Technol, Adv Mat Anal Ctr, Xian 710048, Shaanxi, Peoples R China
Zhu, Tao
[2
]
Li, Ying
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机构:Xian Univ Technol, Adv Mat Anal Ctr, Xian 710048, Shaanxi, Peoples R China
Li, Ying
机构:
[1] Xian Univ Technol, Adv Mat Anal Ctr, Xian 710048, Shaanxi, Peoples R China
[2] Xian Univ Technol, Sch Mat Sci & Engn, Xian 710048, Shaanxi, Peoples R China
[3] China Luoyang Float Glass Grp Co Ltd, Luoyang 471009, Henan, Peoples R China
Combining the spray pyrolysis and the sol-gel techniques gives the possibility to produce Fluorine doped Tin oxide (SnO2:F) thin films. Transparent conducting SnO2:F thin films have been deposited on glass substrates by the spray pyrolysis technique. This technique for the fabrication of SnO2:F filmsby combining sol-gel process and the spray pyrolysis technique is presented in this paper. The Sol-gel precursors have been successfully prepared using SnCl2-5H(2)O and (Ac)F-3. The structural, electrical, and optical properties of these films were investigated. The high resolution transmission electron microscopy (HRTEM) and selected area diffraction (SAD) patterns of SnO2:F films show that the gel films lead to a tetragonal structure. The X-ray diffraction pattern of the films deposited at substrate temperature 530 degrees, the orientation of the films was predominantly [110]. In addition, the surface chemical components were also examined by X-ray photoelectron spectroscopy (XPS) showing the SnO2:F deposited with the atomic concentration ratios Sn/F 1.82:1. The minimum sheet resistance was 50 Omega and average transmission in the visible wavelength range of 300 to 800 nm was 87.25%. Copyright (c) 2008 John Wiley & Sons, Ltd.